JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 176(1-3) 46-51 2010年1月
We measure the binding energy E-b of the Si 2p core-level for Si substrates covered with thin (similar to 1 nm) SiO2 films as a function of X-ray irradiation time (XPS time-dependent measurement). We find that E-b, which correlates with band bendi...
IEEE TRANSACTIONS ON NUCLEAR SCIENCE 56(6) 3180-3184 2009年12月
SET-induced soft-error rates (SER(SET)s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured SER(SET)s for logic LSIs.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE 56(6) 3043-3049 2009年12月
An analytical model is developed to calculate the single-event transient (SET) pulse widths in advanced silicon-on-insulator (SOI) CMOS logic. Waveform analysis reveals that the width of the pulses is large enough to exhibit rail-to-rail trapezoid...
IEEE TRANSACTIONS ON NUCLEAR SCIENCE 56(6) 3180-3184 2009年12月
SET-induced soft-error rates (SER(SET)s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured SER(SET)s for logic LSIs.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE 56(6) 3043-3049 2009年12月
An analytical model is developed to calculate the single-event transient (SET) pulse widths in advanced silicon-on-insulator (SOI) CMOS logic. Waveform analysis reveals that the width of the pulses is large enough to exhibit rail-to-rail trapezoid...
Y. Yanagawa, K. Hirose, H. Saito, D. Kobayashi, S. Fukuda, S. Ishii, D. Takahashi, K. Yamamoto, and Y. Kuroda, IEEE Transactions on Nuclear Science, 53 (6) pp. 3575-3578 (2006)
論文タイトル
Direct measurement of SET pulse widths in 0.2-μm SOI logic cells irradiated by heavy ions
T. Makino, D. Kobayashi, K. Hirose, Y. Yanagawa, H. Saito, D. Takahashi, S. Ishii, M. Kusano, S. Onoda, T. Hirao, and T. Ohshima, IEEE Transactions on Nuclear Science, 56 (1) pp. 202-207 (2009)
論文タイトル
LET dependence of single event transient pulse-widths in SOI logic cell