Alexander G. Shard   Rasmus Havelund   Steve J. Spencer   Ian S. Gilmore   Morgan R. Alexander   Tina B. Angerer   Satoka Aoyagi   Jean-Paul Barnes   Anass Benayad   Andrzej Bernasik   Giacomo Ceccone   Jonathan D. P. Counsell   Christopher Deeks   John S. Fletcher   Daniel J. Graham   Christian Heuser   Tae Geol Lee   Camille Marie   Mateusz M. Marzec   Gautam Mishra   Derk Rading   Olivier Renault   David J. Scurr   Hyun Kyong Shon   Valentina Spampinato   Hua Tian   Fuyi Wang   Nicholas Winograd   Kui Wu   Andreas Wucher   Yufan Zhou   Zihua Zhu   Vanina Cristaudo   Claude Poleunis   
JOURNAL OF PHYSICAL CHEMISTRY B 119(44) 14337-14337 2015年11月 [査読有り]
RAPID COMMUNICATIONS IN MASS SPECTROMETRY 29(18) 1687-1695 2015年9月 [査読有り]
RATIONALE: Time-of-flight secondary ion mass spectrometry (TOF-SIMS) with an Ar cluster ion beam as a primary ion source provides useful information in terms of peptide analysis. It is, however, difficult to interpret the spectra. The ToF-SIMS pep...
Woody thin boards were prepared from lignin, cellulose, and water by compression molding at 180 degrees C and 25 MPa for 10 min. Boards with higher contact angles gave lower values of relative permittivity on their surface. Attenuated-total reflec...
Alexander G. Shard   Rasmus Havelund   Steve J. Spencer   Ian S. Gilmore   Morgan R. Alexander   Tina B. Angerer   Satoka Aoyagi   Jean-Paul Barnes   Anass Benayad   Andrzej Bernasik   Giacomo Ceccone   Jonathan D. P. Counsell   Christopher Deeks   John S. Fletcher   Daniel J. Graham   Christian Heuser   Tae Geol Lee   Camille Marie   Mateusz M. Marzec   Gautam Mishra   Derk Rading   Olivier Renault   David J. Scurr   Hyun Kzong Shon   Valentina Spampinato   Hua Tian   Fuyi Wang   Nicholas Winograd   Kui Wu   Andreas Wucher   Yufan Zhou   Zihua Zhu   
JOURNAL OF PHYSICAL CHEMISTRY B 119(33) 10784-10797 2015年8月 [査読有り]
We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the measurement of composition in organic depth profiling. Layered samples with known binary compositions of Irganox 1010 and either...
飛行時間型2次イオン質量分析法(time of flight secondary ion mass spectrometry; ToF-SIMS)は,試料最表面の化学分析において最も強力な計測手法の1つである.しかし,得られるスペクトルには対象物質由来の分子イオンだけでなく,分子が分裂して生じたフラグメントイオン,基板や汚染に由来する2次イオンが多数含まれるため,結果の解釈には困難が伴う.近年,ToF-SIMSスペクトルデータの解析に多変量解析を用いる試みが広がりつつある.適切な多変量解析...