Shinsaku Hiura

In this paper, we propose a method to accurately measure the shape of objects by suppressing indirect reflection such as interreflection or subsurface scattering. We use a modulation with M-sequence shifted along the line of the slit light to be accurately detected on the captured image in two ways. This method has two advantages; one is the characteristics of propagation of higher spatial frequency components and the other is geometric constraint between the projector and the camera. Prior to the measurement, epipolar constraint is obtained through calibration, and then the phase consistency is evaluated to suppress the interreflection. The value of cross-correlation is used to suppress the dilation of the light caused by the subsurface scattering.

We developed a direction system of real-world operation from distant site. The system consists of several sets of cameras, projectors and PCs connected via network each other. At first, the 3-D shape of the object is measured using pattern light projection method, and it is sent to the distant PC. A supervisor can observe the CG of the object from any viewpoint and draw annotation figures on the CG. The direction message is sent to the real field and projected onto the object using projectors. The projected annotations are well aligned geometrically because the all cameras and projectors are calibrated with single reference object. The worker is free from any wearing equipment, ex. HMD, and multi projectors avoid the problem of occlusion by the worker body. Direction of alignment task of both existing and new object are also implemented.