Microanalysis Society, Microscopy&Microanalysis 2014 Birks Award,Exciting possibilities of soft x-ray emission spectroscopy as chemical state analysis in EPMA and FE-SEMH. Takahashi N. Handa T. Murano M. Terauchi M. Koike T. Kawachi T. Imazono N. Hasegawa M. Koeda T. Nagano H. Sasa Y. Oue Z. Yonezawa S. Kuramoto
M. Koike   T. Hatano   A. S. Pirozhkov   Y. Ueno   M. Terauchi   
Review of Scientific Instruments 95(2) 2024年2月 [査読有り]
A soft x-ray varied-line-spacing (VLS) laminar-type spherical grating with a super-mirror-type (SMT) multilayer was designed for a soft x-ray high resolution flat-field spectrograph in a region of 2–4 keV. The effective groove density of the desig...
Review of Scientific Instruments 94(12) 2023年12月 [査読有り]
Laminar-type spherical diffraction gratings overcoated with carbon-based materials were designed, fabricated, and evaluated for the purpose of enhancing the analytical sensitivity of the flat-field spectrograph in a vacuum ultraviolet region of 35...
M. Koike   T. Hatano   A. S. Pirozhkov   Y. Ueno   M. Terauchi   
Review of Scientific Instruments 94(4) 045109-045109 2023年4月 [査読有り]
Soft x-ray diffraction gratings coated with a supermirror-type multilayer were designed to enhance diffraction efficiency in the energy range of 2–4 keV by means of numerical calculations. The optimized groove depth and incidence angle are 2.05 nm...