Microanalysis Society, Microscopy&Microanalysis 2014 Birks Award,Exciting possibilities of soft x-ray emission spectroscopy as chemical state analysis in EPMA and FE-SEMH. Takahashi N. Handa T. Murano M. Terauchi M. Koike T. Kawachi T. Imazono N. Hasegawa M. Koeda T. Nagano H. Sasa Y. Oue Z. Yonezawa S. Kuramoto
PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015) 1741 040043(1)-040043(4) 2016年 [査読有り]
Boron is the critical trace element in the production of high quality steel, creating a great demand for an efficient detection method of the B-K emission band at around 6.76 nm. To meet this demand we made a simulation study and obtained a practi...
Laser-driven plasma soft X-ray laser, XRL, at a wavelength of 13.9 nm is generated from nickel-like silver plasmas. The polarization state at an end station is considered to be vertically linearly polarized due to the reflections at some Mo/Si mul...
MICROSCOPY AND MICROANALYSIS 20(3) 692-697 2014年6月 [査読有り]
Electron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer w...