e-Journal of Surface Science and Nanotechnology 10 88-91 2012年4月
We investigated defects produced on a graphite surface by bombardment with gas cluster ions consisting of hundreds or thousands of argon atoms, and examined the structural changes of these defects by heat treatment. Two types of defects, craters a...
We have investigated the converging behavior of argon gas cluster ion beam passed through a glass capillary. The gas cluster ions are attractive as a projectile for SIMS from the view point of minimization of the damages. The cluster ion beam of 5...
e-Journal of Surface Science and Nanotechnology 9 301-305 2011年8月 [査読有り]
We study theoretically the trapping of a nanoparticle by a rotational motion around another nanoparticle caused by surface forces comprising electrostatic and Casimir forces. We introduce a local power exponent of the surface force as a function o...
ELECTRICAL ENGINEERING IN JAPAN 176(3) 52-58 2011年8月 [査読有り]
A new cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) was developed, using a size-selected gas cluster ion as a projectile. Because a large gas cluster ion can generate numerous low-energy constituent atoms during a collision wit...
RAPID COMMUNICATIONS IN MASS SPECTROMETRY 25(8) 1070-1074 2011年4月 [査読有り]
In secondary ion mass spectrometry (SIMS) of organic substances, the dissociation of the sample molecules is crucial. We have developed SIMS equipment capable of bombardment, where the primary ions are argon cluster ions with kinetic energy per at...