SURFACE AND INTERFACE ANALYSIS 43(1-2) 241-244 2011年1月 [査読有り]
A size-selected Ar gas cluster ion beam (GCIB) was applied to the SIMS of a polystyrene thin film. The size of Ar cluster ions are selected between 5000 to 500 atoms at an acceleration voltage of 5 and 10 kV using time-of-flight technique. Under t...
SURFACE AND INTERFACE ANALYSIS 43(1-2) 344-349 2011年1月 [査読有り]
Gas cluster (GC) ion sources, such as an argon cluster source, have been employed in SIMS of organic or biomaterials due to their low-energy projectile effect. Recently, it was found that GC-SIMS reportedly provides intact ion detection of protein...
RAPID COMMUNICATIONS IN MASS SPECTROMETRY 24(10) 1405-1410 2010年5月 [査読有り]
A size-selected argon (Ar) gas-cluster ion beam (GCIB) was applied to the secondary ion mass spectrometry (SIMS) of a 1,4-didodecylbenzene (DDB) thin film. The samples were also analyzed by SIMS using an atomic Ar(+) ion projectile and X-ray photo...
The formation of a nanopore in a graphene sheet by collision with an argon cluster is simulated using molecular dynamics method. The number of removed carbon atoms and the size of the nanopore are obtained as a function of the kinetic energy of th...
JOURNAL OF PHYSICAL CHEMISTRY A 113(52) 15217-15222 2009年12月 [査読有り]
Oxygen adsorption and subsequent oxide formation on Cu(110) using a hyperthermal oxygen molecular beam (HOMB) were investigated using X-ray photoelectron spectrometry. The O-uptake curves, which were determined from the evolution of the O-1s peaks...