JOURNAL OF PHYSICAL CHEMISTRY A 113(52) 15217-15222 2009年12月 [査読有り]
Oxygen adsorption and subsequent oxide formation on Cu(110) using a hyperthermal oxygen molecular beam (HOMB) were investigated using X-ray photoelectron spectrometry. The O-uptake curves, which were determined from the evolution of the O-1s peaks...
The secondary ion mass spectrum (SIMS) of a polystyrene thin film was investigated using a size-selected Ar gas cluster ion beam (GCIB). The fragmentation in the SIM spectrum varied by kinetic energy per atom (E(atom)); the E(atom) dependence of t...
RAPID COMMUNICATIONS IN MASS SPECTROMETRY 23(5) 648-652 2009年3月 [査読有り]
In the secondary ion mass spectrometry (SIMS) of organic substances, the molecular weight of the intact ions currently detectable is at best only as high as 1000 Da, which for all practical purposes prevents the technique from being applied to bio...
IEEJ Transactions on Electronics, Information and Systems 129(2) 14-293 2009年 [査読有り]
A new cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) was developed using a size-selected gas cluster ion as a projectile. Since a large gas cluster ion can generate many low-energy constituent atoms in a collision with the surfa...
電気学会論文誌. C, 電子・情報・システム部門誌 = The transactions of the Institute of Electrical Engineers of Japan. C, A publication of Electronics, Information and System Society 129(2) 14-293 2009年 [査読有り]
A new cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) was developed using a size-selected gas cluster ion as a projectile. Since a large gas cluster ion can generate many low-energy constituent atoms in a collision with the surfa...