Journal of Physics: Condensed Matter 35(42) 425001-425001 2023年7月
Abstract
Linearly polarized soft x-rays provide information about electronic or magnetic anisotropy through absorption into materials or generation of photoelectrons. In order to change the relative angle between linear polarization and sample c...
Journal of Physical Chemistry C 126(30) 12802-12808 2022年8月
We systematically investigated electronic evolutions of nonsymmorphic borophene with chemical environments that were realized by the ion exchange method. Electronic structures can be characterized by the topological Z2 invariant. Spectroscopic exp...
To clarify the nature of defects presented in neutron (n)-irradiated highly oriented pyrolytic graphite (HOPG), in situ X-ray diffraction (XRD) observation at room temperature (RT) and high pressure was conducted with synchrotron radiation (SPring...
SOFT X-RAY AND EUV IMAGING SYSTEMS 4146 47-53 2000年
The precise alignment of Extreme Ultra-Violet Lithography (EUVL) imaging system is necessary in order to achieve diffraction-limited performance. Interferometric testing at the exposure wavelength is needed to ensure proper alignment and to achiev...
H Tsubakino   Y Kuroda   M Niibe   
JOURNAL OF THE AMERICAN CERAMIC SOCIETY 82(10) 2921-2923 1999年10月
Surface relief associated with martensitic transformation-tetragonal-to-monoclinic phase transformation-that occurred during isothermal aging at temperatures of 400 and 473 K was observed via atomic force microscopy, using prepolished and thermall...
K Murakami   T Oshino   H Kinoshita   T Watanabe   M Niibe   M Ito   H Oizumi   H Yamanashi   
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 37(12B) 6750-6755 1998年12月
We have designed and started the fabrication of 3-mirror ring-field projection optics for extreme ultraviolet lithography (EUVL) and an experimental exposure system using the projection optics, which enable a large-field (30 mm x 20 mm), high-reso...