Japanese Journal of Applied Physics 63(3) 038001-038001 2024年3月 [査読有り]
Abstract
In coherent X-ray diffraction imaging, speckles on a coherent diffraction pattern must be sampled at intervals sufficiently finer than the Nyquist interval, which imposes an upper limit on the sample size. To overcome the size limitatio...
<title>Abstract</title>The quest for understanding the structural mechanisms of material properties and biological cell functions has led to the active development of coherent diffraction imaging (CDI) and its variants in the hard X-ray regime. He...
Japanese Journal of Applied Physics 60(11) 118001-118001 2021年11月 [査読有り]
Abstract
The optical transfer function (OTF) of an inverse-phase composite zone plate under incoherent illumination was numerically evaluated by convoluting the point spread function (PSF) and transmission distribution of a model sample with gra...
T. Koyama H. Takenaka S. Ichimaru T. Ohchi T. Tsuji H. Takano Y. Kagoshima
10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 1365 24-27 2011年
A multilayer Laue lens (MLL) made from MoSi2/Si has been fabricated aiming at a sub-10-nm spatial resolution for hard x-ray microscopy. A multilayer of 1000 alternating MoSi2 and Si layers with a layer thickness gradually increasing from 5 nm to 3...
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS VI 8139 81390D 2011年 [招待有り]
X-ray nanofocusing devices are capable of focusing X-rays down to sizes of about 10 nm. We have developed a new nanofocusing device, known as total-reflection zone plates (TRZPs), for focusing high-brilliance synchrotron radiation in the hard x-ra...
H. Takenaka S. Ichimaru T. Ohchi T. Koyama T. Tsuji H. Takano Y. Kagoshima
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 186 2009年
To develop a multilayer Laue lens (MLL), we fabricated depth-graded Mo/Si and MoSi2/Si multilayers with each boundary according to the Fresnel zone configuration. The multilayers were deposited by magnetron sputtering. From the result of SEM image...
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