Interfacial structure of laminated polyethylene (PE)/polypropylene (PP) films was investigated by synchrotron X-ray microbeam. The X-ray microbeam (0.9 mu m (vertical) x 1.7 mu m (horizontal)) formed using a phase zone plate was irradiated on the ...
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 45(11) 8542-8548 2006年11月 [査読有り]
The average and-local lattice structures of a strained-Si layer and a SiGe layer epitaxially grown on a [001]-oriented Si wafer are evaluated by means of high-resolution X-ray diffractometry using a usual X-ray beam and a highly parallel synchrotr...
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 45(42-45) L1159-L1161 2006年11月 [査読有り]
A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference wave...
Journal of Synchrotron Radiation 13(5) 373-377 2006年9月 [査読有り]
An X-ray microbeam with a small angular divergence and a narrow energy bandwidth has been produced at BL24XU at SPring-8. The beam size was measured to be 3.1 μm and 1.6 μm in the horizontal and vertical directions, respectively, and the horizonta...
DESIGN, MANUFACTURING AND APPLICATIONS OF COMPOSITES 278-285 2006年 [査読有り]
Interfacial structure of laminated polyethylene (PE) /polypropylene (PP) films was investigated by synchrotron X-ray microbeam. The X-ray microbeam (0.9 mu m (vertical)) formed using, a phase zone plate was irradiated on the cross-section of the l...
Journal of Physics: Conference Series 849 012052-012052 2017年6月
We have improved the performance of a previously reported multilayer zone plate by reducing its outermost zone width, using the same multilayer materials (MoSi2 and Si) and fabrication technique. The focusing performance was evaluated at the BL24X...
XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 1696 2016年
Multilayer zone plate (MZP) technology for hard X-ray focusing was upgraded and its focusing performance was evaluated using 20-keV X-rays at the synchrotron beamline (BL24XU) of SPring-8. The MZP consists of MoSi2 and Si layers alternately deposi...