A thin silicon nano-overlayer (SNOL) fabricated by oxidation and etchback in a separation by implantation of oxygen wafer was investigated by grazing incident x-ray diffraction at incident angles between 0.01 degrees and 0.1 degrees below the crit...
JOURNAL OF APPLIED PHYSICS 97(8) 084318-084322 2005年4月 [査読有り]
Indium phosphide (InP) nanowires epitaxially grown on InP (111)B were investigated by using grazing incidence x-ray diffraction. A broad scattering at the tail of InP (2 (2) over bar0) diffraction and an additional peak at the low angle side were ...
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 44(1-7) L144-L146 2005年 [査読有り]
Fractional -order X-ray reflection profiles of (2 x 1)-InP(001) have been observed for the first time during step-flow growth of metalorganic chemical vapor deposition. Changes of the profiles have revealed that the coverage of (2 x 1) structures ...
Y Kagoshima   K Shimose   T Koyama   Wada, I   A Saikubo   K Hayashi   Y Tsusaka   J Matsui   
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 43(11A) L1449-L1451 2004年11月 [査読有り]
A new and simple idea for scanning differential-phase-contrast (S-DPC) hard X-ray microscopy has been proposed. It only uses a wedge absorber coupled with two intensity detectors, and is much more sensitive to sample structures than absorption con...
T Koyama   Y Kagoshima   Wada, I   A Saikubo   K Shimose   K Hayashi   Y Tsusaka   J Matsui   
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 43(3B) L421-L423 2004年3月 [査読有り]
With the aim towards high-spatial-resolution phase measurement, a novel hard X-ray micro-interferometer using an imaging microscope has been proposed and constructed at Hyogo-BL of SPring-8. It is a wavefront-division-type interferometer consistin...
Journal of Physics: Conference Series 849 012052-012052 2017年6月
We have improved the performance of a previously reported multilayer zone plate by reducing its outermost zone width, using the same multilayer materials (MoSi2 and Si) and fabrication technique. The focusing performance was evaluated at the BL24X...
XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 1696 2016年
Multilayer zone plate (MZP) technology for hard X-ray focusing was upgraded and its focusing performance was evaluated using 20-keV X-rays at the synchrotron beamline (BL24XU) of SPring-8. The MZP consists of MoSi2 and Si layers alternately deposi...