Hibiki Nakano   Naoto Matsuo   Tadao Takada   Kazushige Yamana   Akira Heya   Tadashi Sato   Shin Yokoyama   
IMFEDK 2017 - 2017 International Meeting for Future of Electron Devices, Kansai 32-33 2017年7月 [査読有り]
An input/output characteristics of the inverter composed of the DNA/Si-MOSFET and the parasitic capacity was studied. The DNA was bridged between the Si electrodes those serve as the source and drain with the 120nm-gap-length. At VDD=0V and VDD=3V...